Browsing C3 - Centro de Ciências Computacionais by Subject "Variability"
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Predictive evaluation of electrical characteristics of sub-22 nm FinFET technologies under device geometry variations
(2014)This work evaluates the impact on ION and IOFF currents of variations in process parameters for a set of predictive FinFET technologies from 20 nm to 7 nm. The main contribution of the present study is to identify relevant ...