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Browsing C3 - Artigos Publicados em Periódicos by Author "Reis, Ricardo Augusto da Luz"

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Predictive evaluation of electrical characteristics of sub-22 nm FinFET technologies under device geometry variations

Meinhardt, Cristina; Zimpeck, Alexandra Lackmann; Reis, Ricardo Augusto da Luz (2014)

This work evaluates the impact on ION and IOFF currents of variations in process parameters for a set of predictive FinFET technologies from 20 nm to 7 nm. The main contribution of the present study is to identify relevant ...

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