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dc.contributor.author Olano, Jimmy Fernando Tarrillo
dc.contributor.author Azambuja, José Rodrigo Furlanetto de
dc.contributor.author Kastensmidt, Fernanda Gusmão de Lima
dc.contributor.author Pereira Junior, Evaldo Carlos Fonseca
dc.contributor.author Vaz, Rafael Galhardo
dc.contributor.author Gonçalez, Odair Lelis
dc.date.accessioned 2015-05-31T23:09:17Z
dc.date.available 2015-05-31T23:09:17Z
dc.date.issued 2011
dc.identifier.citation OLANO, Jimmy Fernando Tarrillo et al. Analyzing the effects of TID in an embedded system running in a flash-based FPGA. IEEE Transactions on Nuclear Science, v. 58, n. 6, p. 2855-2862, 2011. Disponível em: <http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6075302>. Acesso em: 13 maio 2015. pt_BR
dc.identifier.issn 0018-9499
dc.identifier.uri http://repositorio.furg.br/handle/1/4979
dc.description.abstract This work analyzes the behavior of a designed embedded system composed of microprocessor, memories and SpaceWire (SpW) links under Total Ionizing Dose (TID) synthesized into a commercial flash-based FPGA from Actel. Two tests were performed: one the FPGA is configured just once at the beginning of the irradiation and the other the FPGA is reconfigured every 5 krad (Si). Results evaluate power supply current (Icc), temperature, function operation and performance degradation. pt_BR
dc.language.iso eng pt_BR
dc.rights restrict access pt_BR
dc.subject Embedded system pt_BR
dc.subject Flash-based FPGA pt_BR
dc.subject Radiation effects pt_BR
dc.subject System on chip pt_BR
dc.subject Total ionizing dose pt_BR
dc.title Analyzing the effects of TID in an embedded system running in a flash-based FPGA pt_BR
dc.type article pt_BR
dc.identifier.doi 10.1109/TNS.2011.2170855 pt_BR


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