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Evaluating neutron induced SEE in SRAM-based FPGA protected by hardware- and software-based fault tolerant techniques

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Resumo

This paper presents an approach to detect SEEs in SRAM-based FPGAs by using software-based techniques combined with a nonintrusive hardware module. We implemented a MIPS-based soft-core processor in a Virtex5 FPGA and hardened it with software- and hardware-based fault tolerance techniques. First fault injection in the configuration memory bitstream was performed in order to verify the feasibility of the proposed approach, detection rates and diagnosis. Furthermore a neutron radiation experiment was performed at LANSCE. Results demonstrate the possibility of employing more flexible fault tolerant techniques to SRAM-based FPGAs with a high detection rate. Comparisons between bitstream fault injection and radiation test is also presented.

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Fault tolerance, Hybrid fault tolerance techniques, Microprocessors, Single event effects (SEEs)

Citação

AZAMBUJA, José Rodrigo Furnaletto de et. al. Evaluating neutron induced SEE in SRAM-based FPGA protected by hardware- and software-based fault tolerant techniques. IEEE Transactions on Nuclear Science, v. 60, n. 6, p. 4243-4250, 2013. Disponível em: <http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6678297>. Acesso em: 24 abr. 2015.

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